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Back-Thinned L3Vision CCDs From e2v Set Unprecedented Standards In Low Light Sensitivity

Chelmsford, UK – October 16, 2003:   By combining the unparalleled quantum efficiency performance of back-thinning with the ultra-low read noise of its electron-multiplying L3Vision™ technology, e2v technologies further raises the bar in the low light imaging sector. Two sensors from the L3Vision™ product range, the CCD60 and the CCD97, are now available with the Company's unique back-thinning process thus creating imaging devices of the ultimate sensitivity.

  The back-illuminated CCD60 was the first CCD to offer sensitivity close to the theoretical maximum for a silicon imaging sensor, with quantum efficiency greater than 90% and read noise less than one electron. The back-thinned CCD60 provides a 128×128 pixel format at frame rates up to 1kHz and extends the scope of CCD sensor applications to include confocal microscopy, single molecule imaging, photon counting and adaptive optics.

Complementing the back-thinned CCD60 in the L3Vision™ product portfolio is the recently launched back-illuminated CCD97. Delivered in a 512×512 frame transfer format, this new 30fps frame rate imager is ideal for high resolution scientific imaging at low light levels. The sensor uses a novel electron multiplication output amplifier circuit that can operate with read noise of less than one photoelectron at pixel rates in excess of 11 MHz.
 
Scientific Charge-Coupled Devices, Janesick
Cliff Weatherup, L3Vision™ Programme Manager at e2v comments, "L3Vision is a breakthrough technology, extending the boundaries of CCD sensitivity and enabling photon counting performance in an imaging sensor. These improvements in high speed, low light imaging open a new window of opportunity and we look forward to providing solutions for customer requirements."
 
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